Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.12104/80931| Title: | Caracterización de películas delgadas de Si1-xGex depositadas mediante la combinación de plasmas de Si y Ge producidos por láser pulsado |
| Author: | Estrada López, Angel |
| Advisor/Thesis Advisor: | Gómez Rosas, Gilberto Quiñonez Galvan, Jose Guadalupe Campos González, Enrique Perez Centeno, Armando |
| Issue Date: | 7-Feb-2020 |
| Publisher: | Biblioteca Digital wdg.biblio Universidad de Guadalajara |
| URI: | https://hdl.handle.net/20.500.12104/80931 https://wdg.biblio.udg.mx |
| metadata.dc.degree.name: | MAESTRIA EN CIENCIA DE MATERIALES |
| Appears in Collections: | CUCEI |
Files in This Item:
| File | Size | Format | |
|---|---|---|---|
| MCUCEI10126.pdf Restricted Access | 1.58 MB | Adobe PDF | View/Open Request a copy |
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