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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12104/31614
Title: CARACTERIZACION MEDIANTE DIFRACCION DE RAYOS X Y MICROSCOPIA ELECTRONICA DE OBRAS DE ARTE RELIGIOSO PROVENIENTES DE LA IGLESIA DE REAL ALTO JALISCO
Author: Ortiz Briseño, Jose Alonso
Advisor/Thesis Advisor: Carlos Rafael Michel Uribe
Publisher: Universidad de Guadalajara
Biblioteca Digital wdg.biblio
URI: http://hdl.handle.net/20.500.12104/31614
http://wdg.biblio.udg.mx
metadata.dc.degree.name: Licenciatura en Química
Appears in Collections:CUCEI

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