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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12104/31614
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dc.contributor.advisorCarlos Rafael Michel Uribe
dc.contributor.authorOrtiz Briseño, Jose Alonso
dc.date.accessioned2015-09-09T17:54:02Z-
dc.date.available2015-09-09T17:54:02Z-
dc.date.submitted2003
dc.identifier.urihttp://hdl.handle.net/20.500.12104/31614-
dc.identifier.urihttp://wdg.biblio.udg.mx
dc.formatapplication/PDF
dc.language.isospa
dc.publisherUniversidad de Guadalajara
dc.publisherBiblioteca Digital wdg.biblio
dc.rights.urihttp://wdg.biblio.udg.mx/politicasdepublicacion.php
dc.titleCARACTERIZACION MEDIANTE DIFRACCION DE RAYOS X Y MICROSCOPIA ELECTRONICA DE OBRAS DE ARTE RELIGIOSO PROVENIENTES DE LA IGLESIA DE REAL ALTO JALISCO
dc.typeTesis de Licenciatura
dc.rights.holderUniversidad de Guadalajara
dc.rights.holderOrtiz Briseño, Jose Alonso
dc.type.conacytbachelorThesis-
dc.degree.nameLicenciatura en Química-
dc.degree.departmentCUCEI-
dc.degree.grantorUniversidad de Guadalajara-
dc.degree.creatorLicenciado en Química-
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