Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.12104/34590
Title: | Caracterización de la calidad de los alambres de cobre comerciales utilizando microscopía de fuerza atómica |
Author: | Resendis Arenas, Mariana Elizabeth |
Advisor/Thesis Advisor: | Héctor Pérez Ladrón de Guevara |
Publisher: | Biblioteca Digital wdg.biblio Universidad de Guadalajara |
URI: | http://hdl.handle.net/20.500.12104/34590 http://wdg.biblio.udg.mx |
metadata.dc.degree.name: | LICENCIATURA EN INGENIERÍA EN ELECTRÓNICA Y COMPUTACIÓN |
Appears in Collections: | CULAGOS |
Files in This Item:
File | Size | Format | |
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LCULAGOS00234FT.pdf Restricted Access | 2.11 MB | Adobe PDF | View/Open Request a copy |
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